Single Sideband Phase Noise Performance Test

This test applies to the following models:

This manual test uses a phase noise test system to verify that the M9383A PXIe signal generator meets the single-sideband phase noise specifications. The reference source used should have equal or better phase noise specifications compared to the DUT. If the DUT fails, it may be due to the phase noise contributions of the reference source. If a failure occurs, a three-source comparison should be done at the failed carrier frequency and offset to identify a true failure.

Required Test Equipment

Test Equipmen

Recommended Models

Alternate Models

Phase noise measurement system

N5511A Options 540, CH21

  1. CH2 is not required but recommended for future capability.

E5505A Option 0011

  1. Option 001 provides high frequency, high power capability.

Reference source

E8257D Options UNT, UNY, 1EU

E8267D Options UNT, [UNX or UNY]
E8257D Options UNT, [UNX or UNY], [1EA or 1EU]

100 MHz reference

M9300A

 

TME data entry form

The values required for this test can be found on the TME data entry form. The form is generated in TME when the Single-Sideband Phase Noise test is started.

The table below explains the terms used in the test and their corresponding Closedcolumns in the data entry form.

Test Value

TME Data Entry Form Column Header

Carrier (DUT) frequency

Frequency

Carrier (DUT) power

Power (dBm)

Measured offset frequencies

Offset Frequency

Connection Setups and Test Procedures

All test equipment requires a 30 minute warmup period to ensure accurate performance.

There are two sets of procedures depending on the model of the phase noise test system used:

Select from the links below according to the phase noise test system being used.