Frequency Response (Trace Data)
DUT Device under Test: An acronym used to describe some type of electrical apparatus connected to test instrumentation. The apparatus can range from a single component to a complex subsystem such as a mobile phone, base station or MSC.) divided by its input (make sure channel M is connected to the input of your DUT and channel N is connected to its output).
trace data is a two-channel measurement defined as the output of a device-under-test (
This trace data is available only when more than a single input channel is selected.
The exact computation used for frequency response depends on the type of average used:
If the average is: |
the VSA uses this formula: |
---|---|
None |
A |
Time |
A |
Time exponential |
A |
rms |
B |
rms exponential |
B |
peak hold/continuous peak hold |
Frequency response is unavailable |
Formulas:
A: (linspec,N) / (linspec,M)
B: (cross spectrum) / (power spectrum Ch M)
Term |
Definition |
---|---|
linspec,N |
linear spectrum channel N |