Keysight Application Notes and Technical papers:
To obtain copies of the following papers, contact the organization or publisher listed.
M. Afsar et al; “Measurement of the Properties of Materials”; proceedings of the IEEE, volume 74, number 1, January 1986. This is an excellent short survey of many methods across wide frequency range. With its 187 references, it is a good starting point for beginners.
H. M. Altschuler; “Dielectric Constant”; chapter 9 of “Handbook of Microwave Measurements” by M. Sucher and J. Fox; Wiley, 1963. This is a good technical reference covering high frequency techniques. It contains detailed procedures and equations (but using slotted line instead of a network analyzer).
ASTM; “Standard Test Methods for AC Loss Characteristics and Permittivity (Dielectric Constant) of Solid Electrical Insulating Materials”; Standard D-150-87; American Society for Testing and Materials, Philadelphia, PA 19103. The US authority on testing methods features great technical depth on parallel-plate capacitor methods for low frequencies.
Richard G. Geyer; “Electrodynamics of Materials for Dielectric Measurement Standardization”; proceedings of the IEEE, IM-TC, January 1990. A review of measurement concerns, standards, and traceability with examples of state-of-the-art measurements including NIST X-band cavity and the first public reference to Baker-Jarvis enhancement to S-parameter technique.
Deepak K. Ghodgaokar et al; “Free Space Method for Measurement of Dielectric Constants and Loss Tangents at Microwave Frequencies”; IEEE Transactions on IM volume 37 number 3, June 1989. This describes the work at Penn States’s Center for Engineering of Electronic/Acoustic Materials. The topic is the free-space method using spot-focusing antennas with an 8510B and TRL calibration.
Arthur R. von Hippel, ed; “Dielectric Materials and Applications”; MIT Press, 1954. This book is over 45 years old, but still the bible on dielectrics and measurements; a good introduction to basics.