# :MEASure:EYE:PAM:OVERshoot

PAM Overshoot Commands

- :MEASure:EYE:PAM:OVERshoot
- :MEASure:EYE:PAM:OVERshoot:FAVorite
- :MEASure:EYE:PAM:OVERshoot:LOCation?
- :MEASure:EYE:PAM:OVERshoot:SOURce
- :MEASure:EYE:PAM:OVERshoot:STATus?
- :MEASure:EYE:PAM:OVERshoot:STATus:DETails?
- :MEASure:EYE:PAM:OVERshoot:STATus:REASon?
- :MEASure:EYE:PAM:OVERshoot:THRatio

## Command Syntax

    :MEASure:EYE:PAM:OVERshoot

## Query Syntax

    :MEASure:EYE:PAM:OVERshoot?

Moves the PAM Overshoot measurement to the top of the Results measurement results. Displays the measurement if it is not already shown on the table. The query form of the command returns the measured value. PAM Overshoot is an IEEE 802.3cu compatible measurement.

The PAM Overshoot measurement is reported as a percentage and is defined as:

Where:

- Pmax is based on a 1e-2 hit ratio, where Pmax is the smallest power level that results in the number of samples above that level not exceeding the product of hit ratio and total number of observed samples. All samples are acquired in a single unit interval eye diagram.

The hit ratio's default setting is 1e-2 and is based on the IEEE 802.3cu standard. However, you can change this ratio using the `:MEASure:EYE:PAM:OVERshoot:THRatio` command.

## Common Measurement Queries

- `:COUNt?`, `:MAXimum?`, `:MINimum?`, `:MEAN?`, and `:SDEViation?` common measurement queries.