# Noise Measurement Results

Subtopics

- Signal Amplitude
- Eye Height
- VEC (1E-XX)
- TI (1E-XX)
- RN (rms)
- DI (δ-δ)
- ISI (p-p)
- PI (δ-δ)
- PI (rms)
- BUI (δ-δ)
- BUI (rms)
- Level
- Bit Count

The Noise content window shows the Noise measurement results. Also displayed are:

- Src — The data source that is used to compute the statistics.

- Rate — (in Hz, non-double data rate) Reported when the pattern length is 2; otherwise, the data rate value being used is reported.

- Pat. Length — The pattern length being used. "Clock" equals a length of 2.

  To learn about pattern length and waveform record length limitations of Jitter analysis, see Jitter Analysis Record Length Requirements.

- UIs — The number of Unit Intervals used for the measurements.

- PROB or SER — Indicator showing the Probability/SER selection in the Advanced Tab.

- SPEC or TF — Indicator showing the Separation Method selection in the Random Jitter/Interference (RJ/RN) area in the Advanced Tab.

Measurement results are reported for both Ones and Zeros levels.

Measurements can be displayed in Volts or the Unit Amplitude as specified by the Noise/Interference Units selection in the Noise Measurements Tab.

The Noise content window also shows the Noise graphs. See: Noise Graphs.