When the unit has the VNA capability (E505xA-x6x), the TDR option (S96011B) provides the following features:
Wide dynamic range to observe the true performance of the DUT
Low noise floor for accurate and repeatable measurements
Fast measurement speed for real-time analysis
State-of-the art calibration techniques reduce measurement errors
Automatic deskew ensures easy removal of fixture and probe effects
Full calibration available for the utmost in measurement accuracy
Quickly obtain accurate TDR/TDT and S-parameter measurements
Easily locate source of loss, reflections and crosstalk by simultaneous analysis of both time and frequency domain
Single connection forward and reverse transmission and reflection measurements
All possible modes of operation (single-ended, differential and mode conversion)
Measure just the device by utilizing advanced calibration techniques to remove cable, fixtures and probe effects
Gain insight into high speed interconnect performance through simulated eye diagram analysis and manual scale of eye diagram
Apply industry standard (PRBS, K28.5) or used specified patterns using the virtual bit pattern generator
Pre-defined masks for many high speed serial standards
No need for pulse generators as the eye diagram is synthesized from measurement results
Hot TDR measurement which allows TDR measurement to be performed while the device is powered ON
Note: SSA-X TDR supports 1 or 2 port measurement for ports of VNA.