Facing stringent requirements in today’s modern communications system design, you must optimize your baseband design to meet performance demands. Starting with the early prototyping of your system, you need to test each functional block as you build it, characterizing the performance of your design by injecting a digital IQ signal stimulus into the circuit and measuring the response. Different test stimuli may be required to stress your design under a variety of test configurations to meet your performance requirements. For example, a long signal scenario or a large number of frames are needed to perform bit error rate (BER) or frame error rate (FER) tests. You need a test solution that provides flexibility, deep memory, and fast speed to perform the test accurately. The test set-up below consists of the Baseband Studio for capture and playback software, the N5101A Baseband Studio PCI card with Option 022, and the N5102A digital signal interface module.
Figure 2. N5110B performs
capture or playback of digital IQ/IF signals directly through an
N5102A digital signal interface module connected to the DUT.