SEM Limit Testing (802.11n/ac/ax/be/bn)
The parameters are specific to spectral emission mask limit testing.
Determines which SEM limit line is used for pass/fail testing and margin computation. The results are shown in the SEM Results trace. This setting also affects the the Spectral Emission Mask trace and the display of the lines in the Markers Window.
Combined – Tests against the combined limit (max of relative and absolute per IEEE Institute of Electrical and Electronics Engineers. A US-based membership organisation that includes engineers, scientists, and students in electronics and related fields. The IEEE developed the 802 series wired and wireless LAN standards. Visit the IEEE at http://www.ieee.org spec).
Relative –Tests against the relative limit only (dBr relative to peak).
Absolute – Tests against the absolute limit only (dBm deciBels referenced to a milliWatt: dB relative to 1 milliwatt dissipated in the nominal input impedance of the analyzer/MHz Megahertz: A unit of frequency equal to one million hertz or cycles per second.). Falls back to Combined if no absolute mask exists for the current standard.
Default: Combined
See Also
