The dielectric probe kit allows measurements of the complex permittivity for a wide range of semi-solid, pliable-solid, and liquid materials. It performs all of the necessary network analyzer control, calculation, and data presentation functions. The software controls the network analyzer to measure the complex reflection coefficient of the material under test (MUT). Then it converts the reflection coefficient into the complex permittivity of the MUT.
Finally it displays the measurement results in a variety of graphical and tabular formats. The software also facilitates printing or plotting the results, saving the results to disk, and saving test setups to disk.
The dielectric probe provides a convenient, repeatable method for measuring various dielectric materials. The convenience is a result of needing only to press the probe against (or immerse it in) the MUT to make a measurement. The probe is used with a vector network analyzer to take advantage of the analyzer’s measurement flexibility, speed, and accuracy. Use of the vector network analyzer allows the software to calibrate out (as detailed later) a variety of measurement errors and thus enhances accuracy.
See Critical Note regarding the Slim Probe Connector Saver.
See Coaxial Probe Measurements for a list of all Opt.004 Help topics.