:MEASure:SNDRatio:SNOise

SNDR Sigma-n Commands

Command Syntax

:MEASure:SNDRatio:SNOise

Query Syntax

:MEASure:SNDRatio:SNOise?

Description

Sigma-n is a measurement of noise on the flattest portion of consecutive symbols according to the selected standard. This measurement returns a combined result for all symbol levels (using a root-square sum).

Sigma-n is an averaged measurement of the RMS deviation from the mean voltage noise (σ) at all signal levels. It represents essentially the crosstalk and all other external noise.

The Sigma-n measurement computes the noise parameter, σn, for waveforms according to the selected technology standard. The parameter σn measures the uncorrelated RMS amplitude noise of each symbol level (including random noise and bounded uncorrelated noise effects), while not including ISI (inter-symbol interference) and jitter effects.

SNDR measurement parameters are defined for the waveform source selected by :MEASure:SNDRatio:SNOise:SOURce.

Example Command Sequence

:MEASure:SNDRatio:SNOise:SOURce CHANnel1
:CHANnel1:SNDRatio:STANdard PCIe
:CHANnel1:SNDRatio:PUINterval 32
:CHANnel1:SNDRatio:NAVerages 8
:CHANnel1:SNDRatio:LFPLength 600
:CHANnel1:SNDRatio:LFPDelay 8
:MEASure:SNDRatio:SNOise
:MEASure:SNDRatio:SNOise?