FETCh:TSEMask

Function

Queries the measurement suite integrity, Spectrum Emission Mask overall pass/fail result, pass/fail results for all three frequency ranges, and average levels for all three frequency ranges.

Query

Integrity Indicator (see Integrity Indicator)

Overall pass/fail result: 0 (pass), 1 (fail)

For each of the three measurement ranges:

•  Overall pass/fail result: 0 (pass), 1 (fail)

•  Average level for offset range:value in dBc and 9.91 E+37 (NAN)

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCh:TSEMask?"

Function

Queries the in-channel power (in dBm/1.28 MHz), number of points tested for the specified lower band, and the power level vectors relative to in-channel power for all points tested in the specified lower band.

Query

in-channel power

• Range:value in dBm and 9.91 E+37 (NAN)

• Resolution:0.01

Number of Points Tested = ((Last Offset - First Offset) / Frequency Step) + 1, where:

• LOWer[1]:

• Last Offset is -0.8 MHz

• First Offset is -1.8 MHz

• step size 10 kHz, BW 30 KHz 1:99

• LOWer2:

• Last Offset is -1.8 MHz

• First Offset is -2.4 MHz

• step size 10 kHz, BW 30 KHz 1:59

• LOWer3:

• Last Offset is -2.4 MHz

• First Offset is -4.0 MHz

• step size 200 kHz, BW 1 MHz 1:4

Power level vectors for the specified lower band:

• Range:value in dBc and 9.91 E+37 (NAN)

• Resolution:0.01

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCh:TSEMask:BAND:LOWer2?"

Function

Queries the in-channel power (in dBm/1.28 MHz), number of points tested for the specified upper band, and the power level vectors relative to in-channel power for all points tested in the specified upper band.

Query

In-channel Power

• Range:value in dBm and 9.91 E+37 (NAN)

• Resolution:0.01

Number of Points Tested = ((Last Offset - First Offset) / Frequency Step) + 1, where:

• LOWer3:

• Last Offset is -2.4 MHz

• First Offset is -4.0 MHz

• step size 200 kHz, BW 1 MHz 1:4

• LOWer2:

• Last Offset is -1.8 MHz

• First Offset is -2.4 MHz

• step size 10 kHz, BW 30 KHz 1:59

• LOWer1:

• Last Offset is -0.8 MHz

• First Offset is -1.8 MHz

• step size 10 kHz, BW 30 KHz 1:99

• UPPer1:

• Last Offset is 1.8 MHz

• First Offset is 0.8 MHz

• step size 10 kHz, BW 30 KHz 1:99

• UPPer2:

• Last Offset is 2.4 MHz

• First Offset is 1.8 MHz

• step size 10 kHz, BW 30 KHz 1:59

• UPPer3:

• Last Offset is 4.0 MHz

• First Offset is 2.4 MHz

• step size 200 kHz, BW 1 MHz 1:4

Power level vectors for the specified lower band:

• Range:value in dBc and 9.91 E+37 (NAN)

• Resolution:0.01

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCh:TSEMask:BAND:UPPer2?"

Function

Queries the measurement suite integrity, in-channel power (in dBm/1.28 MHz), number of measurement points for all bands, and the power level vectors relative to in-channel power for all points tested in all bands.

Query

Integrity Indicator (see Integrity Indicator)

in-channel power

• Range:value in dBm and 9.91 E+37 (NAN)

• Resolution:0.01

 Number of points in trace for all bands,where:

• UPPer[1]:

• Last Offset is 1.8 MHz

• First Offset is 0.8 MHz

• step size 10 kHz, BW 30 KHz 1:99

• UPPer2:

• Last Offset is 2.4 MHz

• First Offset is 1.8 MHz

• step size 10 kHz, BW 30 KHz 1:59

• Upper3

• Last Offset is 4.0 MHz

• First Offset is 2.4 MHz

• step size 200 kHz, BW 1 MHz 1:4

Power level vectors for the specified lower band:

• Range:value in dBc and 9.91 E+37 (NAN)

• Resolution:0.01

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCh:TSEMask:BAND?"

Function

Queries the intermediate count of measurements completed in a multi-measurement

Query

Range: 0 to 999

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCH:TSEMASK:ICOUNT?"

Function

Queries the in-channel average power of a set of values in the multi-measurement.

If Multi-Measurement Count State is off or Multi-Measurement Count Number is 0,the average power equals to the result.

Query

Range:value in dBm and 9.91 E+37 (NAN)

Resolution:0.01

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCh:TSEMask:ICPower?"

Function

Queries the in-channel maximum power of a set of values in the multi-measurement.

If Multi-Measurement Count State is off or Multi-Measurement Count Number is 0,the maximum power equals to the result.

Query

Range:value in dBm and 9.91 E+37 (NAN)

Resolution:0.01

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCh:TSEMask:ICPower:MAXimum?"

Function

Queries the in-channel minimum power of a set of values in the multi-measurement..

If Multi-Measurement Count State is off or Multi-Measurement Count Number is 0,the maximum power equals to the result.

Query

Range:value in dBm and 9.91 E+37 (NAN)

Resolution:0.01

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCh:TSEMask:ICPower:Minimum?"

Function

Queries the in-channel minimum power.

If Multi-Measurement Count State is off or Multi-Measurement Count Number is 0,the maximum power equals to the result.

Query

Range:value in dB and 9.91 E+37 (NAN)

Resolution:0.001

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCh:TSEMask:ICPower:SDEViation?"

Function

Queries statistical  results of the Spectrum Emission Mask measurement,including:

• Minimum value

• Maximum value

• Average (arithmetic mean)

• Standard Deviation

Query

Range:value in dBm and 9.91 E+37 (NAN)

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCh:TSEMask:ICPower:ALL?"

Function

Queries the measurement integrity indicator for the last spectrum emissions mask measurement completed.

Query

Range: see Integrity Indicator

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCH:TSEMASK:INTegrity?"

Function

Queries  the following results for the specified range(1|2|3): in-channel power (in dBm/1.28 MHz), pass/fail result, average level, frequency offset in which the worst case mask margin is found, and the worst case mask margin.

Query

in-channel power/Avg

• Range:value in dBm and 9.91 E+37 (NAN)

• Resolution:0.01

Pass/Fail Result

• Range: 0 = pass, 1 =fail

Level Result/Avg

• Range:value in dBc and 9.91 E+37 (NAN)

• Resolution:0.01

Frequency Offset

• Range 1: +/- (0.815 to 1.795) MHz | NaN (undetermined)

• Range 2: +/- (1.805 to 2.385) MHz | NaN (undetermined)

• Range 3: +/- (2.9 to 3.5) MHz | NaN (undetermined)

• Resolution, all ranges: 10KHz

Mask Margin

• Range:value in dB and 9.91 E+37 (NAN)

• Resolution:0.01  

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCh:TSEMask:RANGe:RANGe3?"

Function

Queries the following for each of the three measurement ranges: in-channel power (in dBm/1.28 MHz), pass/fail result, average level, frequency offset in which the worst case mask margin is found, and the worst case mask margin.

Query

Integrity Indicator

Overall Pass/Fail

• Range: 0 = pass, 1 =fail

• Fail is indicated anytime the mask offset is negative.

in-channel power/Avg

• Range:value in dBm and 9.91 E+37 (NAN)

• Resolution:0.01

For each of the three measurement ranges:

• Pass/Fail Result

• Range: 0 = pass, 1 =fail

• Level Result/Avg

• Range:value in dBc and 9.91 E+37 (NAN)

• Resolution:0.01

• Frequency Offset

• Range 1: +/- (0.815 to 1.795) MHz | NaN (undetermined)

• Range 2: +/- (1.805 to 2.385) MHz | NaN (undetermined)

• Range 3: +/- (2.9 to 3.5) MHz | NaN (undetermined)

• Resolution, all ranges: 10KHz

• Mask Margin

• Range:value in dB and 9.91 E+37 (NAN)

• Resolution:0.01  

Requirements

Test Application Revision: A.01.00 and above

Programming Example

"FETCh:TSEMask:RANGe?"