Spectrum Emission Mask (SEM) Measurement

Last updated: 2014-11-28

Spectrum Emission Mask Measurement Description

Spectrum Emission Mask Measurement Parameters

Spectrum Emission Mask Measurement Results

Input Signal Requirements

Spectrum Emission Mask Measurement Description

Spectrum Emission Mask (SEM), as defined in 3GPP TS 34.122, is a relative measurement of the out-of-channel emissions to the in-channel power. The SEM measurement is  used to measure the excess emissions that would interfere to other channels or to other systems.

Spectrum Emission Mask in the Test Set

 

Frequency Offset from carrier

Measurement Bandwidth

Range 1

0.8-1.8

30 kHz

Range 2

1.8-2.4

30 kHz

Range 3

2.4 – 4.0

1 MHz

This measurement requires the calibration data of the measurement receiver path gain, which are part of the results of the measurement calibration, see Calibrate Measurements.

Spectrum Emission Mask Measurement Parameters

Spectrum Emission Mask Measurement Results

Measurement results can be displayed in either numeric or graphic form.

When the graphic display is used, the result trace of the measurement is displayed. The green line is the spectrum emission mask for each frequency band range. There are four markers in the screen: the three red markers are always on and used to marker the largest mask error of the three frequency ranges; You can also turn on the white marker to see the corresponding frequency offset, relative power level and the margin on the top of screen. The lower part in this screen has six columns, which represents the index, the frequency range, the Pass/Fail result, the frequency Offset,  the average result level and the Mask Margin of the frequency bands respectively.

When the numeric display is used, the Level column displays the average leakage power values measured at each offset, the Margin column displays the Mask Margin value and P/F column shows the Pass/Fail values for each offset.

Input Signal Requirements

Related Topics

GPIB Commands: SETup:TSEMask, FETCh:TSEMask