Noise Sidebands at > 50 kHz Offsets

In the Normal Variant test plan, this test is called Noise Sidebands > 50 kHz Offsets.

This test verifies that the E4406A meets its Noise Sidebands specification for offsets greater than 50 kHz from the center frequency. For units with a serial prefix of US4251/MY4251 or later, the Noise Sidebands are specified. For units with serial prefix lower than US4251/MY4251, Noise Sidebands were a nominal (unwarranted) parameter. For those units with a Noise Sidebands listed as a nominal parameter, this test is performed as a functionality test using limits that are 10 dB relaxed from the nominal value.

In this test, the source is connected to the RF Input and the noise level is measured at offsets of 100 kHz, 600 kHz, 1.2 MHz, 6 MHz, and 10 MHz. In order to minimize the VSA DANL effects, near noise corrections are applied at each offset frequency. Near noise corrections involve measuring the noise sidebands with the RF signal On, and then measuring the DANL with the RF signal Off. Both measurements are then converted to power (in Watts), and the noise power is subtracted from the sideband power.

This test is performed in conjunction with the Noise Sidebands at < 50 kHz Offsets test.

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Related adjustment: Synthesizer 2

Required Test Equipment

Test Equipment

Recommended Model Number
(see main equipment list for alternative models)

RF Source 4

  • Normal Variant only

8665B

RF Source 5

  • Factory Recommended Variant only

E8257D

1.001 GHz notch filter

  • Factory Recommended Variant only

Trilithic CFN-2-1000.1

Cable, Type-N
(2 required)

11500C

Cable, BNC

8120-2582

Connection Setups

Factory Recommended Variant

Normal Variant