This test verifies the analyzer Noise Sideband specification.
The test requires that DANL at 1 GHz be characterized for the near noise corrections. If the DANL test has been run, the DANL test data will be used. If DANL has not been run, then the DANL will be characterized at 1 GHz.
There are two solutions available for testing phase noise.
The preferred solution uses the Wenzel Ultra Low Noise Reference Frequency source. Although the EMI receiver does not require the performance of the Wenzel 500-13438D, other TME applications use the Wenzel solution, so the 500-13438D is an allowed instrument mapping.
The alternate solution used the PSG (Opt. UNX or UNY) signal generator with a notch filter.
A 1.0001 GHz notch filter is employed to reduce the source phase noise at offsets above 100 kHz. The analyzer center frequency is tuned such that the offset frequency is centered in the notch. The notch filters out approximately 5 dB of noise contribution that the source creates. The notch bandwidth is very narrow, so the EMI receiver Resolution Bandwidth must be kept narrow (1 kHz) in order to prevent out-of-band noise from entering the measurement.
Click here for troubleshooting.
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Test Equipment |
Model Number1 |
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Preferred Solution |
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Ultra Low Noise Signal Generator |
Ultra Low Noise Reference Frequency Source Wenzel model 500-13438 Rev D |
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Alternate Solution |
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Signal Generator |
PSG Models with Option UNX or UNY (see equipment list) |
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1 GHz Notch Filter |
Trilithic CFN-2-1000.1 |
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Miscellaneous Devices |
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Termination, 50 ohm |
909A Option 012 |
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Termination, 3.5 mm (m)
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909D |
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Termination, 2.4 mm (f)
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85138B |
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Cable, BNC
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8120-1840 |
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Cable, 3.5 mm coaxial
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11500E |
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Adapter, 3.5 mm (f) to 3.5 mm (f)
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83059B |
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Adapter, Type-N (m) to 3.5 mm (f)
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1250-1744 |
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Adapter, 2.4 mm (f) to 3.5 mm (f) adapter
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11901B |
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