SEM Spectrum (Spectral Emissions Mask)

SEM Spectrum trace is a composite trace showing the detected spectrum data used for computing the carrier power and the offset power values as configured by the Carrier and Offset parameters. When measurement averaging is enabled, SEM Spectrum is averaged over the number of traces specified in the Count field, and the averaging type and count (e.g.," RMS:10") are displayed at the top of the trace's display. See the SEM Spectrum Trace Data Block Diagram and Detectors and Power Spectrum Analysis for more information.

The spectrum data may have different resolution bandwidth per-offset definition, and may have different detectors used for carrier and offset regions.

Marker calculations are disabled on the trace. If marker calculations are desired, use the Spectrum traces for the specific enabled desired detector type.

Any power limit mask defined to be active for offsets is presented on the trace to allow direct viewing of the pass/fail criteria as configured for the measurement. Failing regions of the trace have data drawn to indicate the failure, and marker table displays power limit mask information.

For overlapping regions in SEM, the limit lines reflect the offset with the largest index (If Offset C and Offset D overlap in frequency, Offset D will override any presentation of Offset C). This does not impact the tabular results, only the "SEM Spectrum" visualization of the limit test.