IGBT: Cies Test

Measures the Input Capacitance. Requires the N1272A Device Capacitance Selector SMU.

Used with:

  • B1506A: IGBT DUT
  • B1505A: IGBT DUT, CV test type
Set the test parameters based on the specifications in the device's data sheet:
- If the data sheet lists a maximum test limit for a parameter, use that value.
- If there is no maximum test limit, use a typical value.

See also Setting IV and CV Test Parameters.

Test Schematic

Gate Parameters

VGE (V): The Gate bias voltage (in Volts).

Frequency (Hz): The Measurement signal frequency (in Hz). NOTE: Keysight recommends that you use a 100 kHz measurement frequency when using the B1506A for this test (due to an additional error of its device capacitance switch).

Collector Parameters

VCEStart (V): The VCE sweep start voltage (in Volts).

VCEStop (V): The VCE sweep stop voltage (in Volts).

SweepOutput: Use the drop-down menu to choose the scale of sweep:

  • Linear - Linear sampling (see also the LinearNOS setting)

  • Log10 - 10 points/decade log sampling

  • Log25 - 25 points/decade log sampling

  • LOG50 - 50 points/decade log sampling

LinearNOS: The number of steps for LINEAR sweep scale (see the SweepOutput option).