IGBT: Rg, Cgg-Vg Test

Measures the internal gate resistance, Rg, of the device. The device must have a gate oxide. In IC-CAP and the PEMG software the gate resistance is calculated from the Cox, also known as Cgg or Cg. Cgg = Cgs + Cgd + Cgb. Requires the N1272A Device Capacitance Selector SMU.

Used with:

  • B1506A: IGBT DUT

  • B1505A: IGBT DUT, CV test type
This test requires Rg, Cgg for IGBT PD1000A.XTD configuration file. See Install PD1000A Configuration Files for more information.

 

Set the test parameters based on the specifications in the device's data sheet:
- If the data sheet lists a maximum test limit for a parameter, use that value.
- If there is no maximum test limit, use a typical value.

See also Setting IV and CV Test Parameters.

Test Schematic

Gate Parameters

VGEStart (V): The Sweep start voltage for gate pulse bias.

VGEStop(V): The Sweep stop voltage for gate pulse bias.

Collector Parameters

SweepOutput: Use the drop-down menu to choose the scale of sweep:

  • Linear - Linear sampling (see also the LinearNOS setting)

  • Log10 - 10 points/decade log sampling

  • Log25 - 25 points/decade log sampling

  • LOG50 - 50 points/decade log sampling

LinearNOS: The number of steps for LINEAR SweepOutput.

Frequency (Hz): The Measurement signal frequency (in Hz). NOTE: Keysight recommends that you use a 100 kHz measurement frequency when using the B1506A for this test (due to an additional error of its device capacitance switch).

VCE (V): The Collector voltage.