Advanced Eye Analysis License

The Advanced Eye Analysis feature (F-AEYE) provides the ability to Measure TJ (Total Jitter), DJ (Deterministic Jitter) and RJ (Random Jitter) on patterns longer than PRBS16, such as PRBS31. The feature also provides the ability to perform mask testing based on BER eye contours. The Advanced Eye Analysis panel appears in Eye/Mask Mode's toolbar and an application is installed to guide you through the measurement steps.

The Advanced Eye Analysis Software can operate without any 86100D DCA-X mainframe options, or work together with 86100D-200 Enhanced Jitter Analysis Software, well known for its speed, accuracy, and ease-of-use. When operating with 86100D-200, the application leverages the DCA-X's ability to measure ultra-low levels of Random Jitter (RJ), yet can extend the versatility of Jitter Mode and measure RJ, DJ, and TJ on long patterns such as PRBS23, PRBS31, or even live traffic. When ultra-low random jitter measurements are not required, the Advanced Eye Analysis Software can also operate standalone and perform accurate RJ/DJ/TJ measurements on any eye diagram, including high data-rate signals using spread-spectrum clocking.

Advanced Eye Analysis Software also extends the 86100D's mask testing capability allowing it to perform BER based mask testing at any probability.