Pattern Analysis
L-RND
F-PAT
The F-PAT feature is included in the Research and Development package licenses and, when pattern lock is on, enables Pattern Analysis with these new capabilities:
- Ability to expand the Pattern Navigation Display as an aid to viewing and locating symbols in a pattern waveform.
- Ability to align pattern waveforms to a pattern reference symbol. The reference symbol can either be automatically determined (based on longest "lowest-symbol" runs) or manually set by entering a specific symbol sequence.
- Ability to align pattern waveform memories to a pattern reference symbol. The reference symbol can either be automatically determined (based on longest "lowest-symbol" runs) or manually set by entering a specific symbol sequence.