Pattern Analysis

The F-PAT feature is included in the Research and Development package licenses and, when pattern lock is on, enables Pattern Analysis with these new capabilities:

  • Ability to expand the Pattern Navigation Display as an aid to viewing and locating symbols in a pattern waveform.
  • Ability to align pattern waveforms to a pattern reference symbol. The reference symbol can either be automatically determined (based on longest "lowest-symbol" runs) or manually set by entering a specific symbol sequence.
  • Ability to align pattern waveform memories to a pattern reference symbol. The reference symbol can either be automatically determined (based on longest "lowest-symbol" runs) or manually set by entering a specific symbol sequence.