IGBT Devices Tests and Parameters

The following tests are available, depending on the type of power analyzer, DUT, test type, and instrument option that you use.

If you are using a B1505A power analyzer, you must also select a test type (IV, CV, or Gate Diode).

Cies Test

Measures the Input Capacitance. Requires the N1272A Device Capacitance Selector SMU.

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Coes Test

Measures the Output Capacitance. Requires the N1272A Device Capacitance Selector SMU.

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Cres Test

Measures the Reverse transfer capacitance. Requires the N1272A Device Capacitance Selector SMU.

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Ic-Vce Test

Measures Ic-Vce characteristics for 3-terminal IGBT devices. SMU pulse is used for the Collector-Emitter voltage output. The sweep scale is always linear.

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Ic-Vge Test

Measures Ic-Vge characteristics for 3-terminal IGBT devices. SMU pulse is used for the Collector-Emitter voltage output. (Available only if you choose the H21 Instrument option in the Hardware Configuration dialog.)

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Ic-Vge for Expanders Test (older versions of the PD1000A Control Software).

Measures Ic-Vge transfer characteristics for IGBT devices with multiple Vce values. (Available only if you choose the H51 or H71 Instrument option in the Hardware Configuration dialog.)

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Diode If-Vf Test

Measures the forward bias voltage vs. current characteristics of the body (free-wheeling) diode. SMU voltage pulse is used for the forward bias output.

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Diode Ir-Vr Test

Measures the reverse bias voltage vs. current characteristics of the body (free-wheeling) diode.

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Rg, Cgg-Vg Test

Measures the internal gate resistance, Rg, of the device. The device must have a gate oxide. In IC-CAP and the PEMG software the gate resistance is calculated from the Cox, also known as Cgg or Cg. Cgg = Cgs + Cgd + Cgb. Requires the N1272A Device Capacitance Selector SMU.

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Back to: Step 2. IV and CV Configure Tests and Test Settings

See also: FET Tests and Parameters