:LTESt:ACQuire:CTYPe
Instrument:
N1010A
N1000A
DCA-M
Meas. mode:
Scope
Eye
Jitter
TDR
Flex Apps:
FlexDCA
FlexRT
Command Syntax
:LTESt:ACQuire:CTYPe {WAVeforms | SAMPles | PATTerns}
Query Syntax
:LTESt:ACQuire:CTYPe?
Description
Selects the type of condition to base the acquisition limit tests "run until" condition. Use the :LTESt:ACQuire:STATe
command to enable or disable acquisition limit tests. During the limit test, use the :MEASure:LTESt:ACQuire:COUNt?
query to return the current count of patterns, samples, or waveforms.
- WAVeforms
- Runs the test until the number of waveforms specified by the
:WAVeforms
child command occurs. This option is only available if Acquire Entire Pattern is off (:ACQuire:EPATtern
command is off). - SAMPles
- Runs the test until the number of samples specified by the
:SAMPles
child command occurs. This option is only available if Acquire Entire Pattern is off (:ACQuire:EPATtern
command is off). - PATTerns
- Runs the test until the number of patterns specified by the
:PATTerns
child command occurs. This option is only available if Acquire Entire Pattern is on (:ACQuire:EPATtern
command is on).
Example Command Sequence
This example sequence of commands erases display memory and sets up an acquisition limit test.
:ACQuire:CDISplay :LTESt:ACQuire:CTYPe PATTerns :LTESt:ACQuire:CTYPe:PATTerns 1 :LTESt:ACQuire:STATe ON :ACQuire:RUN *OPC?