:STATus:LTESt:EVENt?

Query Syntax

:STATus:LTESt:EVENt?

Description

Reads the limit test event register to determine the status of individual status bits. The decimal-weighted value of the register is returned. The only bit used is bit 0 (LTEST), which indicated if a limit test has completed.

Reporting of event register bits in the status register system is controlled by the mask loaded into the enable register. All true event bits, that are enabled, are logically "OR"ed, which results in setting true bit 8 (LTEST) of the Operation Status Register.

Use the :LTESt Subsystem subsystem to configure a limit test. The limit test event register is used only when a measurement limit test completes.

Limit Test Register Commands
Register Read Write Command
Event   :STATus:LTESt:EVENt?
Enable (mask) :STATus:LTESt:ENABle
Limit Test Status Register Bits
Bit 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
Bit
Weight
32768 16384 8192 4096 2048 1024 512 256 128 64 32 16 8 4 2 1
Event
Register
LLINE MTEST ACQ MEAS
Enable
Register
                               
Sets to Bit 9 (LTEST) of Operation Status Register

Bit Definitions

LLINE
A true indicates that a limit-line test has completed. Use the :LLINe Subsystem to configure a limit-line-based limit test.
MTEST
A true indicates that the mask test limit test has completed. Use the :LTESt:MTESt:MRESult{N}:STATe command to configure a mask limit test.
ACQ
A true indicates that the specified number of waveforms, samples, or patterns has occurred (acquisition limit test has completed). Use the :LTESt:ACQuire:STATe command to configure an acquisition limit test.
MEAS
A true indicates that the measurements limit test has completed. Use the :LTESt:MEASure:MLIMit:STATe command to configure a measurements limit test.